Non-intrusive MC/DC Measurement based on Traces

TitleNon-intrusive MC/DC Measurement based on Traces
Publication TypeConference Paper
Year of Publication2019
AuthorsAhishakiye, F, Jakšić, S, Lange, FD, Schmitz, M, Stolz, V, Thoma, D
Conference NameTASE
PublisherIEEE
Bibtex: 
@inproceedings {1328,
	title = {Non-intrusive MC/DC Measurement based on Traces},
	booktitle = {TASE},
	year = {2019},
	publisher = {IEEE},
	organization = {IEEE},
	author = {Faustin Ahishakiye and Svetlana Jak{\v s}i{\'c} and Lange, Felix D. and Malte Schmitz and Volker Stolz and Thoma, Daniel}
}